Basic Information
Electron-matter Interaction, Secondary Electrons, Backscattered Electrons, Electron Scattering Mechanisms, Photon Emission. Scanning Electron Microscopy (sem)# Electron Sources, Principle of Image Formation, Electrooptic of Scanning Beam, Signal to Noise Ratio, Contrast and Resolution, Signal Processing, Materials Surface Analysis. X-ray Spectroscopy, Wavelength Dispersive Spectroscopy, Energy Dispersive Spectroscopy. Materials Composition Analysis. The Course Includes a Laboratory.
Faculty: Materials Science and Engineering
|Graduate Studies
Related Books
- Quantitative electron-probe microanalysis
- Quantitative electron-probe microanalysis - Scott, V. D.
- Scanning electron microscopy : physics of image formation and microanalysis - Reimer, Ludwig,
- Scanning electron microscopy and X-ray microanalysis : a text for biologists, materials scientists, and geologists
Semestrial Information
Weekly Hours
2 Academic Credit • 2 Lecture Hours
Responsible(s)
Alexander Brener
Notes
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קבוצה 77 סגורה לסיניים בלבד.
Exams
Session A: 11-04-2024 13:00 - 16:00- אולמן 604. 605.
- חומרים 303. 304. 401.
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Weekly Hours
2 Academic Credit • 2 Lecture Hours
Responsible(s)
Alexander Brener
Exams
Session A: 05-02-2023Registration Groups
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Weekly Hours
2 Academic Credit • 2 Lecture Hours
Responsible(s)
Limei Cha
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