Basic Information
Introduction. Surface Analysis By Means of Electron Beams# Electron Diffraction (leed, Rheed), Auger Electron Spectroscopy, Electron Ion Beams# Ion Scattering, Rutherford Back Scattering (rbs), Channeling, Sputtering, Sims (secondary Ion Mass Spectrometry). Surface Analysis By Means of Photons# X-ray Photoemission Spectroscopy (xps), Ultra-violet Photoemission Spectroscopy (ups). Atomic Resolution Surface Microscopy# Atomic Force Microscopy (afm), Scanning Tunneling Microscopy (stm).
Faculty: Materials Science and Engineering
|Pre-Academic
Semestrial Information
Weekly Hours
2 Academic Credit • 2 Lecture Hours
Responsible(s)
Shaul Michaelson
Notes
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קבוצה 77 סגורה לסיניים בלבד.
Registration Groups
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Weekly Hours
2 Academic Credit • 2 Lecture Hours
Registration Groups
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Weekly Hours
2 Academic Credit • 2 Lecture Hours
Responsible(s)
Shaul Michaelson
Exams
Session A: 26-01-2022 17:00 - 20:00Registration Groups
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