Basic Information
Introduction to Nanoelectronic Devices and Circuits, Advanced Methods To Characterize Nanoscale Electronic Phenomena, Working Principle Of Afm and Cafm, Operation Modes of Cafm, Degradation of Cafm Probe Tips, Dielectric Breakdown in Thin Films, Case Studies# Design of Graphene Coated Tips, Nanoelectronic Characterization, Demo Sessions in Probe Station and in The Cafm Lab. Learning Outcomes# Understanding How to Operate a Conductive Atomic Force Microscope, The Physical and Electrical Interactions Between The Tip and The Sample, And The Main Non-idealities of This Machine. It Is Also Expected That Students Understand Several Physical and Electrical Properties Of Different Nanomaterials That Can Be Monitored in Situ Using This Technique, E.g. Local Tunneling Current Across Thin Dielectrics, Dielectric Breakdown and Resistive Switching, Polycrystallization Of Thin Dielectrics, and Piezoelectricity in Nanowire Arrays.
Faculty: Materials Science and Engineering
|Graduate Studies
Course with no extra credit
318541 - Scanning Probe Microscopy Fundemental Characterization