Basic Information
Reliability Theory# Quantification of Reliability, Graphical Modeling. Failure Mechanism in Vlsi Devices# Esd, Electromigration, Hot Electrons, Radiation Effects. Reliability Statistics And Accelerated Testing, Acceleration Models. Building Reliability Into The Device, Reliability Element in The Design Phases, Production and Assembly, Screening and Comparison of Field Data With Laboratory Experimentation.
Faculty: Materials Science and Engineering
|Undergraduate Studies
Pre-required courses
315016 - Semiconductor Devices For Materials Eng. or 315030 - Properties of Electronic Materials